Abstract
There are many journal papers about process capability indices with multiple characteristics in certain manufacturing assemblies including Cp, Cpk, Cpu, and Cpl. However, all of them assume the data is normal distribution and there is no product level process capability with an example chip resistor. This paper will discuss the affection of sample mean and standard deviations on process capability indices for multiple quality characteristics and its product assembly instead of assuming as normal distributions with the data from simulation. Furthermore, it will present several methodologies to calculate the product process capability with weighted arithmetic mean technique so that we can see how each characteristic effect on the product process.
Library of Congress Subject Headings
Process control--Statistical methods; Quality control--Statistical methods; Electric resistors--Design and construction--Mathematics
Publication Date
7-2017
Document Type
Thesis
Student Type
Graduate
Degree Name
Applied Statistics (MS)
Advisor
Robert Parody
Advisor/Committee Member
Linlin Chen
Advisor/Committee Member
Carol Marchetti
Recommended Citation
Seo, Sujeong, "Production Quality for Process Capability with Multiple Characteristics on the Chip Resistor Production" (2017). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/9576
Campus
RIT – Main Campus
Plan Codes
APPSTAT-MS
