The Atomic Force Microscope (AFM) has demonstrated its usefulness on a nanometer scale surpassing the resolution of conventional profilometers and optical microscopes. The principle of operation and the instrumentation design of the AFM, as well as some application aspects, are described. Emphasis is placed on the imaging mode of the force microscopy in the regime of attractive forces. A new method which is capable of stabilizing attractive mode operation is introduced, along with analysis of the detection mechanism and evaluation of the system performance. Numerous examples illustrate the applicability of attractive mode AFM to a wide variety of samples. The software written to control the data acquisition, processing and display is described.
Library of Congress Subject Headings
Scanning tunneling microscopy
Chen, Yue, "Atomic Force Microscope: System and applications" (1992). Thesis. Rochester Institute of Technology. Accessed from
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