A direct-reading thermal comparator was used to measure the thermal conductivities of several thin solid films. This new application of the thermal comparator was based on heat flow modelling using the thermal constriction resistance, generalized here for the case of a film on the surface of an infinite half-space.
Four dielectric optical coating materials were tested, and found to have thermal conductivities significantly lower than those for the same material in bulk form.
The finite element method was used to estimate the minimum sample dimensions required for accurate results, and the variation of the thermal constriction resistance with the assumed mode of heat flow between the comparator probe tip and the test specimen.
Library of Congress Subject Headings
Optical coatings--Thermal properties--Measurement; Thin films--Optical properties--Measurement
Mechanical Engineering (MS)
Department, Program, or Center
Mechanical Engineering (KGCOE)
J. S. Torok
Stephen D. Jacobs
Alan H. Nye
Amsden, Charles A., "Measurement of the thermal conductivity of thin solid films with a thermal comparator" (1988). Thesis. Rochester Institute of Technology. Accessed from
RIT – Main Campus