Abstract
A spectral method of determining color conversion filter thickness is described. This method uses spectral data from system parameters to determine thickness. Optimization of the input distribution by varying bulb current is discussed. Using the spectral method of thickness variation, two CIE Illuminants, D55 and D65 were simulated. The simulators were measured for goodness of fit and showed a strong similarity with their respective simulators. Mean square deviations were calculated for each Illuminant and were 11.09 and 11.33 for D55 and D65 respectively.
Library of Congress Subject Headings
Light filters--Testing; Optical measurements--Testing; Colorimetry--Simulation methods
Publication Date
7-13-1984
Document Type
Thesis
Student Type
Undergraduate
Degree Name
Imaging Science (BS)
Department, Program, or Center
School of Photographic Arts and Sciences (CIAS)
Advisor
Franc Grum
Recommended Citation
Butterfield, Paul, "Spectral method of color conversion filter thickness applied to simulation of CIE Illuminants" (1984). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/6577
Campus
RIT – Main Campus
Plan Codes
IMGART-MFA
