A research-grade goniospectrophotometer was modified to improve its measurement capabilities for appearance research. Hardware, optical, and environmental modifications produced a device capable of measuring the spectral reflectance factors of a sample over the wavelength range from 380 to 700 nanometers at user-selectable illuminating and viewing geometries. Several extensive Pascal programs were written to provide a user-friendly interface to facilitate the control of the instrument, as well as, the collection, reduction, and display of data.

Library of Congress Subject Headings

Reflectance--Analysis--Technique; Spectrophotometer; Colorimetry--Instruments; Goniometry; Materials--Appearance--Testing

Publication Date


Document Type


Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)


Berns, Roy

Advisor/Committee Member

Fairchild, Mark

Advisor/Committee Member

Rodriguez, Nestor


Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: QC454.R4 M44 1989


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