Quantum sensitivity is an important emulsion property for photographic image formation and is usually calculated from a fraction of grains developable vs. log exposure (F-log E) curve. In this thesis, a new method, the electrolytic grain-size analyzer (EGSA) technique has been developed that will allow one to obtain F-log E curves for each grain size class in polydisperse emulsions. The correctness of the F-log E curve obtained by this new method has been examined by comparing the F-log E curve with that calculated from the normalized D-log E curve in the case of monodisperse emulsions. The problems in EGSA measurement, such as "noise" and emulsion solubility, which affect the accuracy of F-log E curves obtained by such a method, have been solved and are discussed in detail. The technique has been applied to the case of an emulsion with a bimodal grain size distribution.
Library of Congress Subject Headings
Photographic emulsions; Photographic chemistry; Emulsions; Electrochemical analysis
Department, Program, or Center
Chester F. Carlson Center for Imaging Science (COS)
Wen, Zhenhuan, "Fraction of grains development measured by electrolytic grain size analyzer" (1998). Thesis. Rochester Institute of Technology. Accessed from
RIT – Main Campus
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: TR395 .W46 1998