Abstract
A recently developed class of digital filters known as morphological pseudoconvolutions are adapted and applied to Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) images. These filters are shown to outperform, both visually and in the mean square error sense, previously introduced Wiener filtering techniques. The filters are compared on typical STM/AFM images, using both modeled and actual data. The technique is general, and is shown to perform very well on many types of STM and AFM images.
Library of Congress Subject Headings
Scanning tunneling microscopy; Electron microscopy; Digital filters (Mathematics)
Publication Date
8-1-1991
Document Type
Thesis
Department, Program, or Center
Chester F. Carlson Center for Imaging Science (COS)
Advisor
Dougherty, Edward
Advisor/Committee Member
Vaez-Pravani, Mehdi
Advisor/Committee Member
Mizes, Howard
Recommended Citation
Weisman, Andrew D., "Adaption and application of morphological pseudoconvolutions to scanning tunneling and atomic force microscopy" (1991). Thesis. Rochester Institute of Technology. Accessed from
https://repository.rit.edu/theses/2834
Campus
RIT – Main Campus
Comments
Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: QC173.4.S94W44 1991