A recently developed class of digital filters known as morphological pseudoconvolutions are adapted and applied to Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) images. These filters are shown to outperform, both visually and in the mean square error sense, previously introduced Wiener filtering techniques. The filters are compared on typical STM/AFM images, using both modeled and actual data. The technique is general, and is shown to perform very well on many types of STM and AFM images.

Library of Congress Subject Headings

Scanning tunneling microscopy; Electron microscopy; Digital filters (Mathematics)

Publication Date


Document Type


Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)


Dougherty, Edward

Advisor/Committee Member

Vaez-Pravani, Mehdi

Advisor/Committee Member

Mizes, Howard


Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: QC173.4.S94W44 1991


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