•  
  •  
 

Publication Date

1989

Document Type

Paper

Abstract

High frequencies and sub-micron geometries inherent in today’s millimeter wave integrated circuits mandate utilization of low capacitance cross-over structures such as the air-bridge. A silicon based aluminum air-bridge fabrication process is described. The structure and capacitances associated with these aluminum air-bridges was evaluated for potential use in the fabrication of integrated circuit acoustical disturbance sensors.

Included in

Engineering Commons

Share

COinS