MOS Capacitors were used to determine minority carrier lifetimes by obtaining capacitance vs time data (C-U. A test system, utilizing an IBM PC as the driver for a Princeton Applied Research model 410 C-v plotter, Kiethley programmable power supply, and HP4145 parameter analyzer, was built to obtain the C-t data. The data can then be down-loaded to the VAX mainframe computer and analyzed by various FORTRAN programs, using analytical techniques developed by people such as, Zerbst, Schroder and Guldberg, Heiman, and others.
Gratzer, Kevin R.
"Determination of Carrier Lifetime from MOS Capacitors,"
Journal of the Microelectronic Engineering Conference: Vol. 3
, Article 14.
Available at: https://scholarworks.rit.edu/ritamec/vol3/iss1/14