Authors

John Schott

Abstract

Major advances in detector technology and in the ability to process large amounts of spectrometer data have resulted in imaging spectrometers that allow scientists to "see" the condition of materials and to monitor processes.

Publication Date

2004

Comments

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type

Article

Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)

Campus

RIT – Main Campus

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