Abstract

The statistical quality-control technique of windowing takes advantage of the additive property of the Poisson probability distribution and the geometry of the data. There are abundant applications of windowing to observations that naturally occur in arrays or that are produced in them, such as computer chips, which are manufactured many at a time on wafers. Standard statistical procedures are used.

Publication Date

4-2017

Document Type

Article

Department, Program, or Center

School of Mathematical Sciences (COS)

Campus

RIT – Main Campus

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