Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.
Publication Date
9-7-2020
Document Type
Article
Department, Program, or Center
Chester F. Carlson Center for Imaging Science (COS)
Recommended Citation
Cara P. Murphy, John P. Kerekes, Derek A. Wood, Anish K. Goyal, "Practical model for improved classification of trace chemical residues on surfaces in active spectroscopic measurements," Opt. Eng. 59(9) 092012 (7 September 2020) https://doi.org/10.1117/1.OE.59.9.092012
Campus
RIT – Main Campus
COinS
