Abstract

There are many journal papers about process capability indices with multiple characteristics in certain manufacturing assemblies including Cp, Cpk, Cpu, and Cpl. However, all of them assume the data is normal distribution and there is no product level process capability with an example chip resistor. This paper will discuss the affection of sample mean and standard deviations on process capability indices for multiple quality characteristics and its product assembly instead of assuming as normal distributions with the data from simulation. Furthermore, it will present several methodologies to calculate the product process capability with weighted arithmetic mean technique so that we can see how each characteristic effect on the product process.

Publication Date

7-2017

Document Type

Thesis

Student Type

Graduate

Degree Name

Applied Statistics (MS)

Advisor

Robert Parody

Advisor/Committee Member

Linlin Chen

Advisor/Committee Member

Carol Marchetti

Campus

RIT – Main Campus

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