Yue Chen

Abstract

The Atomic Force Microscope (AFM) has demonstrated its usefulness on a nanometer scale surpassing the resolution of conventional profilometers and optical microscopes. The principle of operation and the instrumentation design of the AFM, as well as some application aspects, are described. Emphasis is placed on the imaging mode of the force microscopy in the regime of attractive forces. A new method which is capable of stabilizing attractive mode operation is introduced, along with analysis of the detection mechanism and evaluation of the system performance. Numerous examples illustrate the applicability of attractive mode AFM to a wide variety of samples. The software written to control the data acquisition, processing and display is described.

Library of Congress Subject Headings

Scanning tunneling microscopy

Publication Date

1-1992

Document Type

Thesis

Student Type

Graduate

Advisor

Mehdi Vaez-Iravani

Advisor/Committee Member

Pantazis Mouroulis

Advisor/Committee Member

Roger Easton

Comments

Physical copy available from RIT's Wallace Library at QC173.4.S94 C43 1992

Campus

RIT – Main Campus

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