Abstract

A spectral method of determining color conversion filter thickness is described. This method uses spectral data from system parameters to determine thickness. Optimization of the input distribution by varying bulb current is discussed. Using the spectral method of thickness variation, two CIE Illuminants, D55 and D65 were simulated. The simulators were measured for goodness of fit and showed a strong similarity with their respective simulators. Mean square deviations were calculated for each Illuminant and were 11.09 and 11.33 for D55 and D65 respectively.

Publication Date

7-13-1984

Document Type

Thesis

Student Type

Undergraduate

Degree Name

Imaging Science (BS)

Department, Program, or Center

School of Photographic Arts and Sciences (CIAS)

Advisor

Franc Grum

Campus

RIT – Main Campus

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