The purpose of this paper was to quantitatively analyze off-press color proofing methods for advertising material appearing in halftone publication gravure printing. This type of proofing has been an area of debate for the publications industry, especially in reference to the print quality of advertising material. The correlation between dot gain characteristics and the resulting color differences of off-press color proofing methods has been the center of greatest controversy. This paper has tested to determine if a correlation exists between dot gain characteristics and the resulting colorimetric-matching ability for color proofing methods used in halftone publication gravure. The variable dot-gain feature of an electrophotographic proofing system was tested to determine if this feature improved the color matching ability of the off-press proof to the SWOP offset press proof. This system was analyzed by its' ability to objectively match the SWOP offset press proof for dot gain aimpoints. These aimpoints are used as the quality control tool for advertising material appearing in both halftone gravure and web offset publications printing. The experiment concluded that the dot gain characteristic curve of the electrophotographic off-press proof could be altered to quantitatively match closer to the dot gain of an offset press proof printed to SWOP/GAA Specifications. However, the data did not completely support the authors' hypothesis. A direct correlation between dot gain and the resulting delta E values could not be established. None of the data collected from the electrophotographic test sets completely proved that a change in dot gain produced a closer colorimetric match to the SWOP/GAA Offset Press Proof.
Library of Congress Subject Headings
Proofs (Printing); Color printing; Colorimetric analysis
Department, Program, or Center
School of Print Media (CIAS)
Mudge, Jill Houghton, "An Analysis of how altering exposure effects color differences in critical color areas on electrophotographic off-press proofs" (1992). Thesis. Rochester Institute of Technology. Accessed from
RIT – Main Campus