Author

Anthony Zych

Abstract

This paper discusses research on an automatic focusing system for IC-linewidth measuring instruments. The instrument incorporates a collimated light source, a device to move a sample in small, precise increments, and a charge-coupled device. The autofocusing model would measure the step-height to a focus position. Thickness of samples on an enlarged scale were measured to verify the feasibility of this device.

Library of Congress Subject Headings

Photography--Printing processes--Pigment--Testing; Images, Photographic--Testing

Publication Date

6-24-1987

Document Type

Thesis

Department, Program, or Center

School of Photographic Arts and Sciences (CIAS)

Advisor

Pearson, Milton

Advisor/Committee Member

Engeldrum, Peter

Advisor/Committee Member

Mouroulis, Pantazis

Comments

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works. Physical copy available through RIT's The Wallace Library at: TR515.Z92 1987

Campus

RIT – Main Campus

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