At RIT, a sol-gel method is being used to synthesize lead zirconate titanate (PZT). Techniques available to characterize these films include scanning electron microscopy ellipsometry, energy dispersive analysis using X-rays (EDAX), and X-ray diffraction (XRD) to determine crystallinity. After heating above the Curie temperature, XRD indicated that a perovskite structure, known to be ferroelectric, was obtained for a PZT film.
Verostek, John P.
"Ferroelectric Thin Film Research at RIT,"
Journal of the Microelectronic Engineering Conference: Vol. 5
, Article 26.
Available at: http://scholarworks.rit.edu/ritamec/vol5/iss1/26