An IBM computer, a HP4145B parametric analyzer, a Micromanipulator 410 capacitance meter, and a Keithley 230 voltage source were networked together to form a test setup to measure the recombination and generation lifetimes of minority carriers. The Zerbst relationships were used to calculate lifetimes. Results indicate that the test setup~has the ability to take accurate data, but when the capacitance-time data was analyzed, the calculated lifetimes were not believable. The problem seems to be the quality of the fabricated capacitors and not the setup.
"Performing C-T Measurements,"
Journal of the Microelectronic Engineering Conference: Vol. 4
, Article 25.
Available at: http://scholarworks.rit.edu/ritamec/vol4/iss1/25