This project evaluated the implications of system level electro-static discharge (ESD) on a touch and display driver integrated (TDDI) architecture component. Due to the components unique location in the system, typical component level ESD standards (JEDEC Human Body Model and Charged Device Model) were unable to adequately represent the ESD stresses seen by the integrated circuit (IC) during system level ESD testing (IEC 61000-4-2). An alternative stimulus, transmission line pulse (TLP), has been purposed as a better metric to model the devices performance under system level ESD testing and ESD devices were optimized to this stimulus.
"Electro-Static-Discharge (ESD) Protection in Touch and Display Driver Integrated (TDDI) Systems,"
Journal of the Microelectronic Engineering Conference: Vol. 21
, Article 2.
Available at: http://scholarworks.rit.edu/ritamec/vol21/iss1/2