IlL logic gates were fabricated using a two diffusion, four mask process. The functioning of NOR and OR gates were evaluated, and suggestions for improving the process are given.
Romano, Carl J.
"Evaluation of Integrated Injection Logic Devices at RIT,"
Journal of the Microelectronic Engineering Conference: Vol. 2
, Article 28.
Available at: http://scholarworks.rit.edu/ritamec/vol2/iss1/28