Cross-section staining of p-type diffusions was investigated. The method employed a stain formulation of Diffusion depths of 1.9 microns were delineated and photographed using a scanning electron microscope.
Eynon, Benjamin G. Jr
"Diffusion Staining Techniques,"
Journal of the Microelectronic Engineering Conference: Vol. 1
, Article 9.
Available at: http://scholarworks.rit.edu/ritamec/vol1/iss1/9