Authors

K. Teh
Yen-Wen Lu

Description

We present a low-potential method to control surface roughness of doped polypyrrole through redox-induced transformation in surface morphology. By varying the electric potential of as-deposited doped polypyrrole in aqueous sodium dodecylbenzene sulfonate (0.1M) from -0.6 to +1.5V (vs. Ag/AgCl), doped polypyrrole transforms from being a hydrophilic film (60° contact angle) to a hydrophobic film (107° contact angle). Atomic force microscope measurements verify that the surface morphologies of doped polypyrrole, when subject to applied potentials from -0.6V to +1.5V, change from smooth (average roughness of 3.1 nm) to rough (average roughness of 31.1 nm), representing a 10-fold increase in surface roughness. Based on these evidence, we postulate that the degree of oxidation strongly influence surface roughness.

Date of creation, presentation, or exhibit

2008

Comments

Proceedings of the IEEE MEMS Conference, Tucson, Arizona, January 13-17, 2008 Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type

Conference Proceeding

Department, Program, or Center

Microsystems Engineering (KGCOE)

Campus

RIT – Main Campus

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