Description

There has been a renewed interest in recent years aimed at understanding the relationship between the various different moments of the ultrasound echo signal and the scattering microstructure. This paper considers the variation of second normalized intensity moments with probe pulse bandwidth theoretically and experimentally. Slope and intercept on this graph are shown to be useful features for the microstructure characterization.

Date of creation, presentation, or exhibit

9-20-1995

Comments

Engineering in Medicine and Biology Society 1 (1995) 599-600 "Ultrasound speckle feature extraction for scattering structure characterization," Proceedings of the IEEE 17th Conference: Engineering in Medicine and Biology Society. Institute of Electrical and Electronics Engineers. Held in Montreal, Quebec, Canada: 20-23 September 1995. ©1995 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. This work was supported in part by a grant from the Whitaker Foundation. ISBN: 0-7803-2475-7Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type

Conference Proceeding

Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)

Campus

RIT – Main Campus

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