We have constructed a new speckle imaging system that collects a large number of speckle patterns on the detector area of a large-format CCD. The system is called the RIT-Yale Tip-tilt Speckle Imager (RYTSI) because it uses two galvanometric scanning mirrors to tip and tilt each speckle pattern to a different location on the CCD chip. It therefore solves the bandwidth problem of using CCDs in speckle imaging in a unique way: the mirrors direct speckle patterns across the chip with millisecond accuracy, and the CCD is read out only when the chip is filled with patterns. The instrument was designed to accommodate a variety of detector formats, readout systems, and telescope plate scales; it was initially used at the WIYN Observatory in conjunction with an RIT (Rochester Institute of Technology) 20482 CCD. We present the design of the instrument and a sample of first results, which indicate that the instrument can be expected to recover, with high precision, both astrometric and photometric information for binary and multiple stars.

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Copyright 2006 The Astronomical Society of the Pacific. The authors gladly thank Steven Uhl and Gunnar Richardson of Modelmax Corp., East Rochester, New York, for their superb machining of the main instrument, and the staff of Kitt Peak, particularly Charles Corson, Hillary Mathis, Eugene McDougall, George Will, and Doug Williams, for their help in interfacing RYTSI with theWIYN telescope and for providing their expertise during observing. The authors also thank the anonymous referee for beneficial comments. The construction of the instrument was funded through NSF grant AST-9731165, and funds for the publication of this paper were made available by the College of Engineering at the University of Massachusetts, Dartmouth.ISSN:1538-3873 Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

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Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)


RIT – Main Campus