Quantum sensitivity is an important emulsion property for photographic image formation and is usually calculated from a fraction of grains developable vs. log exposure curve (F-log E curve). A new method, residual grain size analysis using the electrolytic grain-size analyzer (EGSA) to detect undeveloped grains, has been developed that will allow one to readily obtain F-log E curves for each grain size class in polydisperse emulsions. The correctness of the F-log E curve derived by this new method has been examined by comparing the F-log E curve with that calculated from the normalized D-log E curve in the case of mono-disperse emulsions. The problems in EGSA measurement, such as noise and emulsion removal from film base, which affect the accuracy of F-log E curves derived by such a method, have been solved and are discussed in detail. The method has been applied to the case of an emulsion with a bimodal grain size distribution.

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This article may be accessed on the publisher's website (additional fees may apply) at: http://www.imaging.org/store/epub.cfm?abstrid=2729 ISSN:1062-3701 Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type


Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)


RIT – Main Campus