Authors

Jonathan Arney

Abstract

This article may be accessed on the publisher's website (additional fees may apply) at: http://www.imaging.org/store/epub.cfm?abstrid=364 The Yule-Nielsen effect, also called optical dot gain, has often been modeled based on convolutions between halftone dot patterns and a point spread function, PSF, characteristic of the paper. The form of the PSF is generally assumed or measured empirically. An alternative approach to modeling the Yule-Nielsen effect employs a probability function Pp, which describes the fraction of reflected light emerging between halftone dots and under dots. The probability model is shown to fit experimental data on the Yule-Nielsen effect quite well. Moreover, the model can be implemented with simple algebraic expressions rather than the convolution or Fourier calculations required for PSF models. In addition, the quantitative relationship between Pp and PSF is demonstrated.

Publication Date

1997

Comments

Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type

Article

Department, Program, or Center

Chester F. Carlson Center for Imaging Science (COS)

Campus

RIT – Main Campus

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