"Evaluation of lossless compression methods for gray scale document images," Proceedings of the 2000 International Conference on Image Processing (ICIP '00). The Institute of Electrical and Electronics Engineers. Held in Vancouver, Canada: 10-13 September 2000. ©2000 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. A comparative study of lossless compression algorithms is presented. The following algorithms are considered: UNIX compress, gzip, LZW, CCITT Group 3 and Group 4, JBIG, old lossless JPEG, JPEG-LS based on LOCO, CALIC, FELICS, S+P Transform, and PNG. In cases where the algorithm under consideration may only be applied to binary data, the bit planes of the gray scale image are separated, with and without Gray encoding, and the compression is applied to individual bit planes. Testing is done using a set of document images obtained by gray scale scanning of prints of the eight standard CCITT images and a set of nine gray scale pictorial images. The results show that the highest compression is obtained using the CALIC and JPEG-LS algorithms.
Department, Program, or Center
Chester F. Carlson Center for Imaging Science (COS)
Savakis, Andreas, "Evaluation of lossless compression methods for gray scale document images" (2000). Image Processing, The Institute of Electrical and Electronics Engineers (IEEE), vol. 1 (), 136-139. Accessed from
RIT – Main Campus