Abstract

Neugebauer (1937) modeling plays an important role in obtaining end-to-end device characterization profiles for halftone color printer calibration. This paper proposes total least square (TLS) regression methods to estimate the parameters of various Neugebauer models. Compared to the traditional least squares (LS) based methods, the TLS approach is physically more appropriate for the printer modeling problem because it accounts for errors in the measured reflectance of both the primaries and the modeled samples. A TLS method based on print measurements from single-colorant step-wedges is first developed. The method is then extended to incorporate multicolorant print measurements using an iterative algorithm. The LS and TLS techniques are compared through tests performed on two color printers, one employing conventional rotated halftone screens and the other using a dot-on-dot halftone screen configuration. Our experiments indicate that the TLS methods yield a consistent and significant improvement over the LS-based techniques for model parameter estimation. The gains from the TLS method are particularly significant when the number of patches for which measured data is available is limited.

Publication Date

1999

Comments

Copyright 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. ISSN:1057-7149 Note: imported from RIT’s Digital Media Library running on DSpace to RIT Scholar Works in February 2014.

Document Type

Article

Department, Program, or Center

Microelectronic Engineering (KGCOE)

Campus

RIT – Main Campus

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